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LCD Test Equipment

Описание:
This “18-bit, 2-Msps Isolated Data Acquisition Reference Design to achieve maximum SNR and sampling rate” illustrates how to overcome performance-limiting challenges typical of isolated data acquisition system design: Maximizing sampling rate by minimizing propagation delay introduced by digital isolator Maximizing high-frequency AC signal chain performance (SNR) by effectively mitigating ADC sampling clock jitter introduced by the digital isolator

Возможности:

18-Bit, 2Msps, 1-Ch, differential input, isolated data acquisition (DAQ) system Leverages multiSPI™ digital interface of ADS9110 to achieve 2MSPS sampling rate while maintaining a low SPI data rate Source synchronous SPI data transfer mode to minimize isolator propagation delay and improve sampling rate Techniques to reduce Isolator-induced jitter resulting in 12dB improvement in SNR (100kHz Fin, 2-MSPS) Tested design includes theory and calculations, component selection, PCB design, and measurement results

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Описание:
The TIDA-01050 reference design aims to improve the integration, power consumption, performance, and clocking issues typically associated with automatic test equipment. This design is applicable to any ATE system but most applicable to systems requiring a large number of input channels.
Возможности:

Negative rail input (NRI), rail-to-rail output (RRO) Wide output common-mode control range Low power consumption High THD, SNR and ENOB Dual supply on AFE maximizing system performance

Документация:
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Описание:
The TIDA-01052 reference design aims to highlight system performance increases seen using a negative voltage rail on the analog front end driver amplifiers rather than ground. This concept is relative to all analog front ends, however this design is aimed specifically at automatic test equipment.
Возможности:

Negative rail input (NRI), rail-to-rail output (RRO) Wide output common-mode control range Low power consumption High THD, SNR, and ENOB Dual supply on AFE maximizing system performance

Документация:
  • Схемотехника
  • BOM
Описание:
End equipment such as mixed signal SOC testers, memory testers, battery testers, liquid-crystal display (LCD) testers, benchtop equipment, high-density digital cards, high-density power cards, x-Ray, MRI, and so forth require multiple, fast, simultaneous sampling channels with excellent DC and AC performance but at low power and in small board spaces. The proposed solution in this design uses high-performance SAR ADCs (ADS8910B), precision amplifiers (OPA2625), and a precision voltage reference (REF5050).
Возможности:

18 bit 1 MSPS 4 Channel Simultaneous Sampling Data Acquisition system 18 bit NMC DNL; +/- 0.5 LSB INL linearity performance for each channel 101dB SNR, 124dB THD with 2kHz Sine wave input on each channel >110dB Channel to Channel Isolation This circuit design is tested and includes Getting Started guide.

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Документация:
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